Principles of testing electronic systems
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a syst...
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| Format: | Book |
| Language: | English |
| Published: |
New York
John Wiley & Sons
2000
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| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | 11259 | ||
| 003 | MY-KLNDU | ||
| 005 | 20241218055225.0 | ||
| 008 | 150904 2000 nyua bi 000 0 eng d | ||
| 020 | |a 0471319317 | ||
| 039 | 9 | |a 201509041001 |b azraai |y 200910081530 |z VLOAD | |
| 040 | |a UPNM | ||
| 090 | |a TK 7867 |b .M697 2000 | ||
| 100 | 1 | |a Mourad, Samiha | |
| 245 | 1 | 0 | |a Principles of testing electronic systems |c Samiha Mourad, Yervant Zorian |
| 260 | |a New York |b John Wiley & Sons |c 2000 | ||
| 300 | |a xix, 420 p. |b ill. |c 25 cm | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | 0 | |a pt.I. Design and TEST -- Overview of Testing -- Defects, Failures, and Faults -- Design Representation -- VLSI Design Flow -- pt.II. Test Flow -- Role of Simulation in Testing -- Automatic Test Pattern Generation -- Current Testing -- pt.III. Design for Testability -- Ad Hoc Techniques -- Scan-Path Design -- Boundary-Scan Testing -- Built-in Self-Test -- pt.IV. Special Structures -- Memory Testing -- Testing FPGAs and Microprocessors -- pt.V. Advanced Topics -- Synthesis for Testability -- Testing SOCs | |
| 520 | |a A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. | ||
| 650 | 0 | |a Electronic circuits |x Testing | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing | |
| 700 | 1 | |a Zorian, Yervant | |
| 999 | |a vtls000011030 |c 11259 |d 11259 | ||