Principles of testing electronic systems
A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a syst...
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| Format: | Book |
| Language: | English |
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New York
John Wiley & Sons
2000
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Table of Contents:
- pt.I. Design and TEST
- Overview of Testing
- Defects, Failures, and Faults
- Design Representation
- VLSI Design Flow
- pt.II. Test Flow
- Role of Simulation in Testing
- Automatic Test Pattern Generation
- Current Testing
- pt.III. Design for Testability
- Ad Hoc Techniques
- Scan-Path Design
- Boundary-Scan Testing
- Built-in Self-Test
- pt.IV. Special Structures
- Memory Testing
- Testing FPGAs and Microprocessors
- pt.V. Advanced Topics
- Synthesis for Testability
- Testing SOCs