Handbook of surface and interface analysis methods for problem-solving
Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe...
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York
Marcel Dekker
1998
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Call Number : | QC 173.4.S94 H35 1998 |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | 11309 | ||
| 003 | MY-KLNDU | ||
| 005 | 20241218055232.0 | ||
| 008 | 151026 1998 nyua bi 000 0 eng d | ||
| 020 | |a 0824700805 | ||
| 039 | 9 | |a 201510261053 |b azraai |y 200910081532 |z VLOAD | |
| 040 | |a UPNM | ||
| 090 | |a QC 173.4.S94 |b H35 1998 | ||
| 245 | 0 | 0 | |a Handbook of surface and interface analysis |b methods for problem-solving |c edited by J.C. Rivière, S. Myhra |
| 260 | |a New York |b Marcel Dekker |c 1998 | ||
| 300 | |a xxv, 968 p. |b ill. |c 23 cm | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | 0 | |a Introduction / J. C. Riviere, S. Myhra -- Elements of Problem-Solving / S. Myhra, J. C. Riviere -- How to Use This Book / S. Myhra, J. C. Riviere -- Spectroscopic Techniques: X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and Ion Scattering Spectroscopy / Gar B. Hoflund -- Compositional Analysis by Auger Electron and X-ray Photoelectron Spectroscopy / Graham C. Smith -- Ion Beam Techniques: Surface Mass Spectrometry / Birgit Hagenhoff, Derk Rading -- In-depth Analysis: Methods for Depth Profiling / F. Reniers -- Ion Beam Effects in Thin Surface Films and Interfaces / I. Bertoti, M. Menyhard, A. Toth -- Surface Modification by Ion Implantation / D. M. Ruck -- Introduction to Scanned Probe Microscopy / S. Myhra -- Metallurgy / R. K. Wild -- Microelectronics and Semiconductors / E. Paparazzo -- Minerals, Ceramics, and Glasses / R. St. C. Smart -- Composites / P. M. A. Sherwood -- Corrosion and Surface Analysis: An Integrated Approach Involving Spectroscopic and Electrochemical Methods / N. S. Mclntyre, R. D. Davidson, I. Z. Hyder [et al.] -- Problem-Solving Methods in Tribology with Surface-Specific Techniques / C. Donnet -- Catalyst Characterization / W. E. S. Unger, T. Gross -- Adhesion Science and Technology / J. F. Watts -- Archaeomaterials / E. Paparazzo -- App.1. Physical Constants and Conversion Factors -- App.2. Data for the Elements and Isotopes -- App.3. Less Commonly Used Techniques for Analysis of Surfaces and Interfaces / Gar B. Hoflund, J. C. Riviere -- App.4. Core-Level Binding Energies, Auger Kinetic Energies, and Modified Auger Parameters for Some Chemical Elements in Various Compounds -- App.5. Documentary Standards in Surface Analysis: The Way of the Future? / S. J. Harris | |
| 520 | |a Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function. | ||
| 650 | 0 | |a Surfaces (Physics) |x Analysis | |
| 650 | 0 | |a Interfaces (physical sciences) |x analysis | |
| 650 | 0 | |a Surface chemistry | |
| 650 | 0 | |a Surfaces (technology) |x analysis | |
| 700 | 1 | |a Rivière, J. C. | |
| 700 | 1 | |a Myhra, S. (Sverre) |d 1943- | |
| 999 | |a vtls000011173 |c 11309 |d 11309 | ||