Handbook of surface and interface analysis methods for problem-solving
Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe...
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| Format: | Book |
| Language: | English |
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New York
Marcel Dekker
1998
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Table of Contents:
- Introduction / J. C. Riviere, S. Myhra
- Elements of Problem-Solving / S. Myhra, J. C. Riviere
- How to Use This Book / S. Myhra, J. C. Riviere
- Spectroscopic Techniques: X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and Ion Scattering Spectroscopy / Gar B. Hoflund
- Compositional Analysis by Auger Electron and X-ray Photoelectron Spectroscopy / Graham C. Smith
- Ion Beam Techniques: Surface Mass Spectrometry / Birgit Hagenhoff, Derk Rading
- In-depth Analysis: Methods for Depth Profiling / F. Reniers
- Ion Beam Effects in Thin Surface Films and Interfaces / I. Bertoti, M. Menyhard, A. Toth
- Surface Modification by Ion Implantation / D. M. Ruck
- Introduction to Scanned Probe Microscopy / S. Myhra
- Metallurgy / R. K. Wild
- Microelectronics and Semiconductors / E. Paparazzo
- Minerals, Ceramics, and Glasses / R. St. C. Smart
- Composites / P. M. A. Sherwood
- Corrosion and Surface Analysis: An Integrated Approach Involving Spectroscopic and Electrochemical Methods / N. S. Mclntyre, R. D. Davidson, I. Z. Hyder [et al.]
- Problem-Solving Methods in Tribology with Surface-Specific Techniques / C. Donnet
- Catalyst Characterization / W. E. S. Unger, T. Gross
- Adhesion Science and Technology / J. F. Watts
- Archaeomaterials / E. Paparazzo
- App.1. Physical Constants and Conversion Factors
- App.2. Data for the Elements and Isotopes
- App.3. Less Commonly Used Techniques for Analysis of Surfaces and Interfaces / Gar B. Hoflund, J. C. Riviere
- App.4. Core-Level Binding Energies, Auger Kinetic Energies, and Modified Auger Parameters for Some Chemical Elements in Various Compounds
- App.5. Documentary Standards in Surface Analysis: The Way of the Future? / S. J. Harris


