Random testing of digital circuits Theory & application
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| Main Author: | |
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| Format: | Book |
| Published: |
New YorklbMarcel Dekker,Inclc1998
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| Call Number : | TK 7874 D365 1998 |
MARC
| LEADER | 00000pam a2200000 4500 | ||
|---|---|---|---|
| 001 | 11394 | ||
| 003 | MY-KLNDU | ||
| 005 | 20241218055245.0 | ||
| 020 | 0 | 0 | |a 0824701828 |
| 035 | |a 0000013856 | ||
| 039 | 9 | |y 200910081535 |z VLOAD | |
| 090 | 0 | 0 | |a TK 7874 |b D365 1998 |
| 100 | 1 | 0 | |a DavidlhRene |
| 245 | 1 | 0 | |a Random testing of digital circuits |b Theory & application |c By Rene David |
| 260 | 0 | 0 | |a New YorklbMarcel Dekker,Inclc1998 |
| 300 | |a xix, 475p. |b ill. |c 23cm | ||
| 500 | 0 | 0 | |a Includes bibliographical references and index |
| 650 | 0 | 0 | |a Digital integrated circuits |x Testing |
| 999 | |a vtls000011347 |c 11394 |d 11394 | ||