Digital circuit testing and testability

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Bibliographic Details
Main Author:	Lala
Format:	Book
Published:	London Academic Press 1997
Subjects:	Digital integrated circuits > Testing Integrated circuits > Very large scale integration > Testing Integrated circuits > Fault tolerance
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LEADER	00000pam a2200000 4500
001	18953
003	MY-KLNDU
005	20241218061306.0
020	0	0	\|a 0124343309
035			\|a 0000019320
039		9	\|y 200910091021 \|z VLOAD
090	0	0	\|a TK 7874.75. \|b L35 1997
100	1	0	\|a Lala \|h Parag K
245	1	0	\|a Digital circuit testing and testability \|c Parag K.Lala
260	0	0	\|a London \|b Academic Press \|c 1997
500	0	0	\|a Includes bibliographical references and index
650	0	0	\|a Digital integrated circuits \|x Testing
650	0	0	\|a Integrated circuits \|x Very large scale integration \|x Testing
650	0	0	\|a Integrated circuits \|x Fault tolerance
999			\|a vtls000019285 \|c 18953 \|d 18953