Integrated circuit failure analysis a guide to preparation techniques
The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designe...
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Chichester ; New York
Wiley
1998.
|
| Series: | Wiley series in quality and reliability engineering
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000nam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | 257 | ||
| 003 | MY-KLNDU | ||
| 005 | 20241218050613.0 | ||
| 008 | s1998 xxka bi 000 0 eng d | ||
| 020 | |a 0471974013 (hbk) | ||
| 020 | |a 9780471974017 (hbk) | ||
| 039 | 9 | |a 201510191543 |b ros |c 201503121517 |d shahrim |y 200910081126 |z VLOAD | |
| 040 | |a UPNM | ||
| 090 | |a TK 7871.852 |b .B43 1998 | ||
| 100 | 1 | |a Beck, Friedrich | |
| 245 | 1 | 0 | |a Integrated circuit failure analysis |b a guide to preparation techniques |c Friedrich Beck ; translated by Stephen S. Wilson. |
| 260 | |a Chichester ; |a New York |b Wiley |c 1998. | ||
| 300 | |a xiv, 173 p |b ill. |c 24 cm. | ||
| 490 | 1 | |a Wiley series in quality and reliability engineering | |
| 500 | |a "Revised edition of Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen, VCH Verlagsgesellschaft mbH, 1988"--T.p. verso. | ||
| 504 | |a Includes bibliographical references and index | ||
| 520 | |a The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designer must constantly expand the range of analytical and preparative methods, adapting them to the needs of new technologies in order to successfully locate faults and ensure optimum quality. | ||
| 650 | 0 | |a Semiconductors |x Testing. | |
| 650 | 0 | |a Semiconductors |x Failures. | |
| 830 | 0 | |a Wiley series in quality and reliability engineering | |
| 999 | |a vtls000000177 |c 257 |d 257 | ||