Integrated circuit failure analysis a guide to preparation techniques
The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right. The circuit designe...
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| Main Author: | Beck, Friedrich |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Chichester ; New York
Wiley
1998.
|
| Series: | Wiley series in quality and reliability engineering
|
| Subjects: | |
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