Mathematical models for systems reliability

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Bibliographic Details
Main Author: Epstein, Benjamin 1918-
Other Authors: Weissman, Ishay 1940-
Format: Book
Language:English
Published: Boca Raton, FL. CRC Press c2008
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Description
Item Description:"A Chapman & Hall book."
Physical Description:253 p. ill. 25 cm.
Bibliography:Includes bibliographical references and index
ISBN:1420080822 (alk. paper)
9781420080827 (alk. paper)