SiGe and Si strained-layer epitaxy for silicon heterostructure devices

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Bibliographic Details
Other Authors: Cressler
Format: Book
Published: Boca Raton CRC Press/Taylor & Francis c2008
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020 0 0 |a 9781420066852 (alk. paper) 
020 0 0 |a 1420066854 (alk. paper) 
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039 9 |a 200911181404  |b VLOAD  |c 200911181221  |d VLOAD  |y 200910091816  |z VLOAD 
090 0 0 |a TK7871.96 .B55  |b S53 2008 
245 0 0 |a SiGe and Si strained-layer epitaxy for silicon heterostructure devices  |c edited by John D. Cressler 
260 0 0 |a Boca Raton  |b CRC Press/Taylor & Francis  |c c2008 
300 |a 1 v. (various pagings)  |b ill.  |c 26cm 
500 0 0 |a "The materials was previously published in Silicon heterostructure handbook : materials, fabrication, devices, circuits and applications of SiGe and Si strained-layer epitaxy, Taylor & Francis. 2005"--T.p. verso 
504 0 0 |a Includes bibliographical references and index 
591 |a 0000006837  |b 10/12/08  |c 0200-07  |d 1  |e RM234.02  |f 1  |g 234.02  |h INTRABAKTI SD.BHD. 
592 |a IN04071  |b 29/04/09  |c RM213.97  |d 1  |e 213.97 
650 0 0 |a Bipolar transistors  |x Materials 
650 0 0 |a Heterostructures 
650 0 0 |a Silicon  |x Electric properties 
650 0 0 |a Epitaxy 
700 1 1 |a Cressler  |h John D. 
999 |a vtls000038907  |c 29158  |d 29158