Speckle metrology
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysi...
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Marcel Dekker
1993
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| Series: | Optical engineering (Marcel Dekker, Inc.)
v. 38 |
| Subjects: | |
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| 090 | |a TA 417.2 |b .S66 1993 | ||
| 245 | 0 | 0 | |a Speckle metrology |c edited by Rajpal S. Sirohi |
| 260 | |a New York, NY |b Marcel Dekker |c 1993 | ||
| 300 | |a xiii, 551 p. |b ill. |c 24 cm. | ||
| 490 | 1 | |a Optical engineering |v 38 | |
| 504 | |a Includes bibliographical references and index | ||
| 505 | |a Theory and Applications of Speckle Displacement and Decorrelation / I. Yamaguchi -- Techniques of Displacement and Deformation Measurements in Speckle Metrology / Pramod K. Rastogi -- Speckle Methods in Experimental Mechanics / Rajpal S. Sirohi -- Recent Developments in Video Speckle Interferometry / Ole J. Lokberg -- Novel Applications of Speckle Metrology / Chandra S. Vikram -- Particle Image Velocimetry / K. D. Hinsch -- White Light Speckle Metrology / Anand K. Asundi -- Surface Roughness Evaluation / J. D. Briers -- Automatic Fringe Analysis Procedures in Speckle Metrology / G. H. Kaufmann -- Speckle Metrology Using Hololenses / Chandra Shakher -- Correlation Speckle Interferometry in the Mechanics of Contact Interaction / Yuri I. Ostrovsky, V. P. Shchepinov | ||
| 520 | |a This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis. | ||
| 650 | 0 | |a Nondestructive testing | |
| 650 | 0 | |a Speckle metrology | |
| 700 | 1 | |a Sirohi, Rajpal S. | |
| 830 | 0 | |a Optical engineering (Marcel Dekker, Inc.) |v v. 38 | |
| 999 | |a vtls000004056 |c 3485 |d 3485 | ||