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Fundamentals of dimensional metrology

Aims to offer a direct path to understanding and applying the principles, techniques, and devices used within the dimensional metrology field. This edition uses both the Metric and Imperial systems, yet emphasizes Metric measurement devices and concepts in all examples.

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Bibliographic Details
Main Author:	Dotson, Connie (Author)
Format:	Book
Language:	English
Published:	New York Thomson Delmar 2006
Edition:	5th edition
Subjects:	Measuring instruments. Measurement.
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