Testing for EMC compliance approaches and techniques

The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become borin...

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Bibliographic Details
Main Author: Montrose, Mark I.
Corporate Author: IEEE Electromagnetic Compatibility Society
Other Authors: Nakauchi, Edward M.
Format: Book
Language:English
Published: Hoboken, NJ IEEE Press/Wiley-Interscience c2004
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LEADER 00000pam a2200000 4500
001 38037
003 MY-KLNDU
005 20241218091442.0
008 150818 2004 njua bi 000 0 eng d
020 |a 047143308X 
039 9 |a 201508181034  |b azraai  |y 200910091635  |z VLOAD 
040 |a UPNM 
090 |a TK 7867.2  |b .M66 2004 
100 1 |a Montrose, Mark I. 
245 1 0 |a Testing for EMC compliance  |b approaches and techniques  |c Mark I. Montrose, Edward M. Nakauchi 
260 |a Hoboken, NJ  |b IEEE Press/Wiley-Interscience  |c c2004 
300 |a xviii, 460 p.  |b ill.  |c 25 cm 
500 |a "IEEE Electromagnetic Compatibility Society, sponsor." 
504 |a Includes bibliographical references and index 
505 |a Introduction -- Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing -- Radiated Testing -- General Approaches to Troubleshooting -- On-Site Troubleshooting Techniques -- App.A. Building Probes -- App.B. Test Procedures 
520 |a The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. 
650 0 |a Electromagnetic compatibility 
650 0 |a Electromagnetic interference 
700 1 |a Nakauchi, Edward M. 
710 2 |a IEEE Electromagnetic Compatibility Society 
999 |a vtls000028113  |c 38037  |d 38037