Testing for EMC compliance approaches and techniques
The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become borin...
Saved in:
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Hoboken, NJ
IEEE Press/Wiley-Interscience
c2004
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000pam a2200000 4500 | ||
|---|---|---|---|
| 001 | 38037 | ||
| 003 | MY-KLNDU | ||
| 005 | 20241218091442.0 | ||
| 008 | 150818 2004 njua bi 000 0 eng d | ||
| 020 | |a 047143308X | ||
| 039 | 9 | |a 201508181034 |b azraai |y 200910091635 |z VLOAD | |
| 040 | |a UPNM | ||
| 090 | |a TK 7867.2 |b .M66 2004 | ||
| 100 | 1 | |a Montrose, Mark I. | |
| 245 | 1 | 0 | |a Testing for EMC compliance |b approaches and techniques |c Mark I. Montrose, Edward M. Nakauchi |
| 260 | |a Hoboken, NJ |b IEEE Press/Wiley-Interscience |c c2004 | ||
| 300 | |a xviii, 460 p. |b ill. |c 25 cm | ||
| 500 | |a "IEEE Electromagnetic Compatibility Society, sponsor." | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | |a Introduction -- Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing -- Radiated Testing -- General Approaches to Troubleshooting -- On-Site Troubleshooting Techniques -- App.A. Building Probes -- App.B. Test Procedures | ||
| 520 | |a The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. | ||
| 650 | 0 | |a Electromagnetic compatibility | |
| 650 | 0 | |a Electromagnetic interference | |
| 700 | 1 | |a Nakauchi, Edward M. | |
| 710 | 2 | |a IEEE Electromagnetic Compatibility Society | |
| 999 | |a vtls000028113 |c 38037 |d 38037 | ||


