Electron and ion microscopy and microanalysis principles and applications
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York
Marcel Dekker
1991
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| Edition: | 2nd ed., rev. and expanded. |
| Series: | Optical engineering (Marcel Dekker, Inc.)
v. 29. |
| Subjects: | |
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| Summary: | The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr |
|---|---|
| Physical Description: | xiv, 837 p. ill. 27 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0824785568 |