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Electron and ion microscopy and microanalysis principles and applications

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Bibliographic Details
Main Author: Murr, Lawrence E.
Format: Book
Language:English
Published: New York Marcel Dekker 1991
Edition:2nd ed., rev. and expanded.
Series:Optical engineering (Marcel Dekker, Inc.) v. 29.
Subjects:
Electron microscopy.
Field microscopy.
Microphobe analysis.
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