Digital communications test and measurement high-speed physical layer characterization
As digital communications systems move to higher and higher speeds, engineers are faced with challenges not just in design, but also in testing and measuring those systems. This is a guide to the testing and measurement of these systems.
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| Other Authors: | , |
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| Format: | Book |
| Language: | English |
| Published: |
Upper Saddle River, NJ
Prentice Hall
c2008
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| Series: | Prentice Hall modern semiconductor design series. Prentice Hall signal integrity library
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| Subjects: | |
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Table of Contents:
- Fundamentals of digital communcations systems
- Jitter basics
- Serial communication systems and modulation codes
- Bit error ratio testing
- BERT Scan Measurements
- Waveform Analysis-Real-time Scopes
- Characterizing high-speed digital communcations signals and systems with the equivalent-time sampling oscilloscope
- High-speed waveform analysis using all-optical sampling
- Clock synthesis, phase locked loops, and clock revocery
- Jitter tolerance testing
- Sensitivity testing in optical digital communications
- Stress tests in high-speed serial links
- Measurements on interconnects
- Frequency domain measurements
- Jitter and signaling testing for chip-to-chip link components and systems.