APA (7th ed.) Citation

Schroder. (2006). Semiconductor material and device characterization (3rd ed.). IEEE Press Wiley.

Chicago Style (17th ed.) Citation

Schroder. Semiconductor Material and Device Characterization. 3rd ed. [Piscataway, NJ] Hoboken, N.J: IEEE Press Wiley, 2006.

MLA (9th ed.) Citation

Schroder. Semiconductor Material and Device Characterization. 3rd ed. IEEE Press Wiley, 2006.

Warning: These citations may not always be 100% accurate.