Semiconductor material and device characterization
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| Main Author: | |
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| Format: | Book |
| Published: |
[Piscataway, NJ] Hoboken, N.J.
IEEE Press Wiley
c2006
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| Edition: | 3rd ed. |
| Subjects: | |
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| Item Description: | ''Wiley-Interscience." |
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| Physical Description: | xv, 779p. ill. 25cm. |
| Bibliography: | Includes bibliographical references and index |
| ISBN: | 9780471739067 (acid-free paper) 0471739065 (acid-free paper) |