Semiconductor material and device characterization
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| Main Author: | |
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| Format: | Book |
| Published: |
[Piscataway, NJ] Hoboken, N.J.
IEEE Press Wiley
c2006
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| Edition: | 3rd ed. |
| Subjects: | |
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| 100 | 1 | 0 | |a Schroder |h Dieter K. |
| 245 | 1 | 0 | |a Semiconductor material and device characterization |c Dieter K. Schroder |
| 250 | 0 | 0 | |a 3rd ed. |
| 260 | 0 | 0 | |a [Piscataway, NJ] |b IEEE Press |a Hoboken, N.J. |b Wiley |c c2006 |
| 300 | |a xv, 779p. |b ill. |c 25cm. | ||
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| 504 | 0 | 0 | |a Includes bibliographical references and index |
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