Advanced Ta-based diffusion barriers for Cu interconnects

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Bibliographic Details
Main Author: Hubner, Rene
Format: Electronic eBook
Language:English
Published: New York : Nova Science Publishers, c2009.
Subjects:
Online Access:NetLibrary
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Call Number :TK7874.53 .H83 2009eb

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245 1 0 |a Advanced Ta-based diffusion barriers for Cu interconnects  |h [electronic resource] /  |c Ren�e H�ubner. 
260 |a New York :  |b Nova Science Publishers,  |c c2009. 
300 |a 1 online resource (93 p.) :  |b ill. 
500 |a Description based on print version record. 
504 |a Includes bibliographical references (p. [73]-86) and index. 
650 0 |a Interconnects (Integrated circuit technology) 
650 0 |a Integrated circuits. 
650 0 |a Electrodiffusion. 
655 7 |a Electronic books.  |2 local 
776 0 8 |i Print version:  |a H�ubner, Ren�e.  |t Advanced Ta-based diffusion barriers for Cu interconnects.  |d New York : Nova Science Publishers, c2009  |z 9781604564518  |z 1604564512  |w (DLC) 2008008583  |w (OCoLC)192082716 
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