Single event phenomena / George C. Messenger, Milton S. Ash

Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip tran...

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Bibliographic Details
Other Authors: Ash, Milton S.
Format: Book
Language:English
Published: New York, NY Chapman & Hall 1997
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Summary:Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip transitor densities are ever-increasing, this volume will be an invaluable reference for any one working in this area.
Physical Description:xvii, 351 p. ill. 24 cm.
Bibliography:Includes bibliographical references and index
ISBN:0412097311