Single event phenomena / George C. Messenger, Milton S. Ash
Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip tran...
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| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Chapman & Hall
1997
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| 245 | 1 | 0 | |a Single event phenomena / George C. Messenger, Milton S. Ash |
| 260 | |a New York, NY |b Chapman & Hall |c 1997 | ||
| 300 | |a xvii, 351 p. |b ill. |c 24 cm. | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | |a 1. Preliminaries -- 2. Extraterrestrial SEU-Inducing Particles -- 3. Particle Penetration and Energy Deposition -- 4. Single Event Upset: Experimental -- 5. Single Event Upset Error Rates -- 6. Single Event Phenomena I -- 7. Single Event Phenomena II -- 8. Single Event Upset Practice. | ||
| 520 | |a Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip transitor densities are ever-increasing, this volume will be an invaluable reference for any one working in this area. | ||
| 650 | 0 | |a Cosmic rays | |
| 700 | 1 | |a Ash, Milton S. | |
| 999 | |a vtls000051949 |c 4357 |d 4357 | ||