Single event phenomena / George C. Messenger, Milton S. Ash

Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip tran...

Full description

Saved in:
Bibliographic Details
Other Authors: Ash, Milton S.
Format: Book
Language:English
Published: New York, NY Chapman & Hall 1997
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
Table of Contents:
  • 1. Preliminaries
  • 2. Extraterrestrial SEU-Inducing Particles
  • 3. Particle Penetration and Energy Deposition
  • 4. Single Event Upset: Experimental
  • 5. Single Event Upset Error Rates
  • 6. Single Event Phenomena I
  • 7. Single Event Phenomena II
  • 8. Single Event Upset Practice.