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Optical components, systems, and measurement techniques / Rajpal S. Sirohi, Mahendra P. Kothiyal

Presents optical techniques and measurement procedures, providing basic background information on optics and lasers, their components and basic systems.

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Bibliographic Details
Main Author: Sirohi, Rajpal S.
Other Authors: Kothiyal, Mahendra P.
Format: Book
Language:English
Published: New York, NY Marcel Dekker 1991
Series:Optical engineering (Marcel Dekker, Inc.) v. 28
Subjects:
Optical measurements
Lasers
Optical instruments
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MARC

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040 |a UPNM 
090 |a TA 1522  |b .S57 1991 
100 1 |a Sirohi, Rajpal S. 
245 1 0 |a Optical components, systems, and measurement techniques / Rajpal S. Sirohi, Mahendra P. Kothiyal 
260 |a New York, NY  |b Marcel Dekker  |c 1991 
300 |a viii, 445 p.  |b ill.  |c 24 cm. 
490 1 |a Optical engineering  |v v. 28 
504 |a Includes bibliographical references and index 
505 |a Light sources, detectors, and recording media -- Optical components -- Basic optical systems -- Length measurement techniques -- Alignment and angle measurement techniques -- Heterodyne and phase shifting interferometry -- Hologram interferometry and speckle metrology -- Optical data processing -- Photoelasticity -- Fiber-optic sensors -- Miscellaneous techniques 
520 |a Presents optical techniques and measurement procedures, providing basic background information on optics and lasers, their components and basic systems. 
650 0 |a Optical measurements 
650 0 |a Lasers 
650 0 |a Optical instruments 
700 1 |a Kothiyal, Mahendra P. 
830 0 |a Optical engineering (Marcel Dekker, Inc.)  |v v. 28 
999 |a vtls000004189  |c 4732  |d 4732 

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