Optical metrology
Modern sources of radiation, modulators, beam scanners, photo detectors and computer-assisted detection, and display of information have contributed to the growing interest in the use of optical technology to solve a wide variety of measurement problems. This self-contained book presents in-depth co...
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| Format: | Book |
| Language: | English |
| Published: |
Chichester, UK
John Wiley & Sons
1995
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| Edition: | 2nd ed. |
| Subjects: | |
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Table of Contents:
- Basics
- Gaussian Optics
- Interference
- Diffraction
- Light Sources and Detectors
- Holography
- Moire Methods
- Speckle Methods
- Photoelasticity and Polarized Light
- Digital Image Processing
- Fringe Analysis
- Some Other Optical Metrology Techniques