Terahertz metrology

This new book describes modern terahertz (THz) systems and devices and presents practical techniques for accurate measurement with an emphasis on evaluating uncertainties and identifying sources

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Bibliographic Details
Other Authors: Naftaly, Mira (Editor)
Format: Book
Language:English
Published: Boston, MA Artech House [2015]
Subjects:
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040 |a UPNM  |b eng  |c UPNM  |e rda 
090 |a QC 454.T47  |b T445 2015 
245 0 0 |a Terahertz metrology  |c Mira Naftaly, editor 
264 1 |a Boston, MA  |b Artech House  |c [2015] 
264 4 |c © 2015 
300 |a xx, 359 pages  |b illustrations  |c 24 cm 
336 |a text  |2 rdacontent 
337 |a unmediated  |2 rdamedia 
338 |a volume  |2 rdacarrier 
504 |a Includes bibliographical references and index 
505 0 |a Terahertz time-domain spectrometers; Parameter extraction in time-domain spectrometers; Metrology for time-domain spectrometers; Evaluation of uncertainty in time-domain spectroscopy; Metrology for Fourier transform spectrometers; THz spectrometer calibration; THz imaging; Metrology for vector network analyzers; Terahertz optics; THz laser sources; Electronic sources of THz radiation and THz detectors 
520 |a This new book describes modern terahertz (THz) systems and devices and presents practical techniques for accurate measurement with an emphasis on evaluating uncertainties and identifying sources 
592 |a 00012905/18  |b 26/11/2018  |c RM 690.24  |h Areesh 
650 0 |a Terahertz spectroscopy 
650 0 |a Metrology 
650 0 |a Terahertz technology 
700 1 |a Naftaly, Mira  |e editor 
999 |a vtls000061565  |c 50784  |d 50784