APA (7th ed.) Citation

Benninghoven, Hagenhoff, & Werner. (1997). Secondary ion mass spectrometry: Sims x. John Wiley & Sons.

Chicago Style (17th ed.) Citation

Benninghoven, Hagenhoff, and Werner. Secondary Ion Mass Spectrometry: Sims X. London: John Wiley & Sons, 1997.

MLA (9th ed.) Citation

Benninghoven, et al. Secondary Ion Mass Spectrometry: Sims X. John Wiley & Sons, 1997.

Warning: These citations may not always be 100% accurate.