Secondary ion mass spectrometry sims x
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| Format: | Book |
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London
John Wiley & Sons
1997
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| 039 | 9 | |a 200910081421 |b VLOAD |y 200910081401 |z VLOAD | |
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| 100 | 1 | 0 | |a Benninghoven |h A. |
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b sims x |c A. Benninghoven, B. Hagenhoff & H. W. Werner |
| 260 | 0 | 0 | |a London |b John Wiley & Sons |c 1997 |
| 300 | |a xxv, 1057p. |b ill. |c 23cm | ||
| 500 | 0 | 0 | |a Includes index |
| 650 | 0 | 0 | |a Secondary ion mass spectrometry |
| 700 | 1 | 1 | |a Hagenhoff |h B. |
| 700 | 1 | 1 | |a Werner |h H. W. |
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