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Microelectronics failure analysis desk reference

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Bibliographic Details
Format: Book
Language:English
Published: Materials Park, Ohio ASM International 2019
Edition:Seventh edition
Subjects:
Electronics > Materials > Testing > Handbooks, manuals, etc
Microelectronics > Materials > Testing > Handbooks, manuals, etc
Microelectronics > Materials > Defects > Handbooks, manuals, etc
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc
Semiconductors > Defects > Handbooks, manuals, etc
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Description
Item Description:"An ASM materials solutions publication."
"EDFAS, Electronic Device Failure Analysis Society, ASM International."
Physical Description:xi, 705 pages illustrations (some color) 28 cm
Bibliography:Includes bibliographical references and indexes
ISBN:9781627082457 (hbk)

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