Random testing of digital circuits Theory and application
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| Main Author: | |
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| Format: | Book |
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New York lbMarcel Dekker lc1998
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| 039 | 9 | |y 200910081519 |z VLOAD | |
| 090 | 0 | 0 | |a TK7874 |b D365 1998 |
| 100 | 1 | 0 | |a David lhRene |
| 245 | 1 | 0 | |a Random testing of digital circuits |b Theory and application |c Rene David |
| 260 | 0 | 0 | |a New York lbMarcel Dekker lc1998 |
| 300 | |a Xix, 475p |b ill |c 23cm | ||
| 500 | 0 | 0 | |a Includes bibliographical references and index |
| 650 | 0 | 0 | |a Digital intergrated circuits |x testing |
| 999 | |a vtls000010178 |c 9922 |d 9922 | ||