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Integrated circuit quality and reliability

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of co...

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Bibliographic Details
Main Author:	Hnatek, Eugene R.
Format:	Book
Language:	English
Published:	New York, NY Marcel Dekker 1995
Edition:	2nd ed., rev. and expanded
Series:	a Electrical engineering and electronics 41
Subjects:	Integrated circuits > Reliability
Tags:	Add Tag No Tags, Be the first to tag this record!
Call Number :	TK 7874 .H535 1995

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