Burn-in testing its quantification and optimization
When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stres...
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| Format: | Book |
| Language: | English |
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Upper Saddle River, NJ
Prentice Hall PTR
1997
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| 090 | |a TK 7870 |b .K363 1997 | ||
| 100 | 1 | |a Kececioglu, Dimitri | |
| 245 | 1 | 0 | |a Burn-in testing |b its quantification and optimization |c Dimitri Kececioglu, Feng-Bin Sun |
| 260 | |a Upper Saddle River, NJ |b Prentice Hall PTR |c 1997 | ||
| 300 | |a xxviii, 668 p. |b ill. |c 24 cm. | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | |a Introduction -- Burn-in definitions, classifications, documents and test conditions -- Frequently encountered terminologies and acronyms in burn-in testing -- Phenomenological observations and the physical insight of the failure process during burn-in -- Math models describing the failure process during burn-in and their parameters' estimation -- Burn-in time determination using a quick calculation approach -- Burn-in time determination based on the bimodal times-to-failure distribution -- Mean residual life (MRL) concept and its applications to burn-in time determination -- Burn-in time determination for the minimum cost -- Burn-in quantification and optimization using the bimodal mixed-exponential distribution -- The total-time-on-test (TTT) transform and its application to burn-in time determination -- Accelerated burn-in testing and burn-in time reduction algorithms -- Accelerated burn-in using temperature cycling -- Guidelines for burn-in quantification and optimum burn-in time determination | ||
| 520 | |a When scientifically planned and conducted, burn-in testing offers one of the most effective methods of reliability screening at the component level. By testing individual elements under constant temperature stress, electrical stress, temperature cycling stress, or a combined thermal-electrical stress, burn-in testing can identify discrete faults that may be harder to perceive at the assembly, module, or system level. This book covers all aspects of burn-in testing, from basic definitions to state-of-the-art concepts. Drawing on a broad database of studies, Burn-In Testing emphasizes mathematical and statistical models for quantifying the failure process, optimizing component reliability, and minimizing the total cost. Vividly illustrated with figures, tables and charts, Burn-In Testing includes: * Definitions, classifications, and test conditions * A review of failure patterns during burn-in * Seven general mathematical models including four bathtub curve models * A quick calculation approach for time determination * Representative cost models and burn-in time optimization * The bimodal mixed-exponential life distribution applied to quantify and optimize burn-in * The Mean Residual Life (MRL) concept applied to quantify and optimize burn-in * The Total Time on Test (TTT) transform and the TTT plot applied to quantify and optimize burn-in * Accelerated testing and its quantification * A roadmap for practical applications With each chapter, Burn-In Testing also offers the appropriate FORTRAN code for the processes described. Burn-In Testing is ideal for practicing engineers in the fields of reliability, life testing, and product assurance. It is also useful for upper division and graduate students in these and related fields. | ||
| 650 | 0 | |a Electronic apparatus and appliances |x Testing | |
| 650 | 0 | |a Environmental testing | |
| 700 | 1 | |a Sun, Feng-Bin | |
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