Search Results - Christoph Ullmann~
Suggested Topics within your search.
Suggested Topics within your search.
- Social aspects 2
- Brain 1
- Cognitive Science 1
- Cognitive neuroscience 1
- Corporate culture 1
- Decision Making 1
- Decision making 1
- Defects 1
- Electronic apparatus and appliances 1
- Electronics 1
- International business enterprises 1
- Management 1
- Materials 1
- Mental Processes 1
- Microelectronics 1
- National security 1
- Physiological aspects 1
- Security, International 1
- Semiconductors 1
- Testing 1
- physiology 1
-
1
Better than conscious? decision making, the human mind, and implications for institutions /
Published 2008NetLibrary
MITCogNet subscription required
Cognet Books
Electronic Conference Proceeding eBook -
2
Security studies a reader
Published 2011Table of Contents: “…National security as an ambiguous symbol / Arnold Wolfers -- Redefining security / Richard Ullman -- The national security problem in international relations / Barry Buzan -- The concept of security / David Baldwin -- Security and emancipation / Ken Booth -- Feminism and security / J. …”
Book -
3
The Blackwell handbook of cross-cultural management
Published 2002Table of Contents: “…MENDENHALL, TORSTEN M. KUHLMANN, GUNTHER K. STAHL, AND JOYCE S. OSLAND -- PART IV MOTIVATION, REWARDS, AND LEADERSHIP BEHAVIOR 185 -- 10 Culture, Motivation, and Work Behavior 190 -- RICHARD M. …”
Book -
4
Microelectronics failure analysis desk reference
Published 2019Table of Contents: “…Orozco ; Fault isolation using time domain reflectometry, electro optical terahertz pulse reflectometry and time domain transmissometry / Hemachandar Tanukonda Devarajulu, Deepak Goyal, and Mayue Xie ; Frontside sample preparation / Jim Colvin ; Backside preparation and optics / Jim Colvin and Christopher Colvin ; Photon emission in silicon-based integrated circuits / Christian Boit, Anne Beyreuther, and Norbert Herfurth ; Physics of laser-based failure analysis / Felix Beaudoin and Edward Cole, Jr. ; Localizing defects with thermal detection techniques / Paiboon Tangyunyong and Christian Schmidt ; 3D hot-spot localization by lock-in thermography / Sebastian Brand and Frank Altmann ; LADA and SDL : powerful techniques for marginal failures / Dan Bodoh and Kent Erington ; Laser voltage probing of integrated circuits : implementation and impact / Keith A. …”
Book


