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Microelectronics failure analysis desk reference
Published 2019Table of Contents: “…Alers ; 2.5D and 3D packaging failure analysis techniques / Douglas Hunt, Pradip Pichumani, Kevin Distelhusrst, and Michael Coster ; Failure analysis techniques and methods for microelectromechanical systems / David E. Grosjean ; Failure analysis of capacitors and inductors / Javaid Qazi and Masahai Ikeda ; Screening for counterfeit electronic parts / Bhanu Sood and Diganta Das -- section 9. …”
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