Leo by Moorey, Teresa

Basic concepts of chemistry by Malone, Leo J. (Leo Jackson) 1938-

Basic concepts of chemistry by Malone, Teo J. (Leo Jackson) 1938-

PostgreSQL up and running by Obe, Regina O., Hsu, Leo S.

Laksamana Cheng Ho dan Asia Tenggara

Nice guys finish last by Durocher, Leo, 1906-1991

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Psychological factors and cardiovascular disorders the role of stress and psychosocial influences /

Table of Contents: “…Walton -- Emotions and the heart / Leo Sher.…”
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A Book of Golden Deeds by Yonge, Charlotte M., 1823-1901 (Charlotte Mary)

“…Elmo -- The voluntary convict -- The housewives of Lowenburg -- Fathers and sons -- The soldiers in the snow -- Gunpowder perils -- Heroes of the plague -- The second of September -- The Vendeans.…”
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Rataplan, a Rogue Elephant; and Other Stories by Velvin, Ellen

“…Rataplan, rogue -- Géan, the giraffe -- Keesa, the kangaroo -- Cara, the camel -- Siccatee, the squirrel -- Leo, the lion -- Chaffer, the chamois -- Jinks, the jackal -- Pero, the porcupine -- Tera, the tigress -- Hippo, hippopotamus -- Osra,…”
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Statistics for the 21st century methodologies for applications of the future

Table of Contents: “…Fisher in the 21st century / Bradley Efron -- Students can help improve college teaching: a review and an agenda for the statistics profession / John D. …”

Multinational firms the global-local dilemma

Table of Contents: “…Location strategies -- Hierarchical location choice and multinational firms strategy: A nested logit model applied to Japanese investment in Europe / Thierry Mayer, Jean-Louis Mucchielli -- The geographic concentration of FDI in Asia / Keith Head, Thierry Mayer, John Ries -- Relocation and public aid: A first report / Leo Sleuwaegen, Enrico Pennings -- Clusters, innovation and growth: A comparative study of European countries / Catherine Beaudry, Stefano Breschi, Peter Swann…”

Microelectronics failure analysis desk reference

Table of Contents: “…Vanderlinde ; Surface analysis and material characterization techniques used in semiconductor industry to identify and prevent failures / Vladimir Dmitrovic, Rama I. Hegde, Andrew J. Mawer, Rik J. Otte, D. Martin Knotter, and Sven Kayser ; Transmission electron microscopy / Swaminathan Subramanian and Raghaw Rai ; Scanning probe microscopy for nanoscale semiconductor device analysis / Phil Kaszuba -- section 7. …”