Telecommunications survival guide by Moulton, Pete 1944-

Teaching hard, teaching soft a structured approach to planning and running effective training courses by Corder, Colin 1941-

Microelectronics failure analysis desk reference

Table of Contents: “…Orozco ; Fault isolation using time domain reflectometry, electro optical terahertz pulse reflectometry and time domain transmissometry / Hemachandar Tanukonda Devarajulu, Deepak Goyal, and Mayue Xie ; Frontside sample preparation / Jim Colvin ; Backside preparation and optics / Jim Colvin and Christopher Colvin ; Photon emission in silicon-based integrated circuits / Christian Boit, Anne Beyreuther, and Norbert Herfurth ; Physics of laser-based failure analysis / Felix Beaudoin and Edward Cole, Jr. ; Localizing defects with thermal detection techniques / Paiboon Tangyunyong and Christian Schmidt ; 3D hot-spot localization by lock-in thermography / Sebastian Brand and Frank Altmann ; LADA and SDL : powerful techniques for marginal failures / Dan Bodoh and Kent Erington ; Laser voltage probing of integrated circuits : implementation and impact / Keith A. …”

Modern battery engineering a comprehensive introduction