Reliability and failure of electronic materials and devices

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

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Bibliographic Details
Main Author: Ohring, Milton 1936
Other Authors: Kasprzak, Lucian
Format: Book
Language:English
Published: Boston Elsevier/Academic Press 2015
Edition:Second edition
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Perpustakaan Jeneral Tun Ibrahim

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