Reliability and failure of electronic materials and devices
"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston
Elsevier/Academic Press
2015
|
| Edition: | Second edition |
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Table of Contents:
- An Overview of electronic devices and their reliability
- Electronic devices: how they operate and are fabricated
- defects, contaminants, and yield
- Mathematics of failure and reliability
- Mass transport-Induced failure
- Electronic charge-induced damage
- Environmental damage to electronic products
- Packaging materials, processes, and stresses
- Degradation of contacts and package interconnections
- Degradation and failure of electro-optical materials and devices
- Characterization and failure analysis of materials and devices
- Future directions and reliability issues